Exposure Maps: Removing Reliance on Attribution During Scan Detection

David Whyte, Paul C. van Oorschot, Evangelos Kranakis. Exposure Maps: Removing Reliance on Attribution During Scan Detection. In 1st USENIX Workshop on Hot Topics in Security, HotSec'06, Vancouver, BC, Canada, July 31, 2006. USENIX Association, 2006. [doi]

Abstract

Abstract is missing.