Built-In Self-Test for Low-Voltage High-Speed Analog-to-Digital Converters

Jason Wibbenmeyer, Chien-In Henry Chen. Built-In Self-Test for Low-Voltage High-Speed Analog-to-Digital Converters. IEEE T. Instrumentation and Measurement, 56(6):2748-2756, 2007. [doi]

Authors

Jason Wibbenmeyer

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Chien-In Henry Chen

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