Jason Wibbenmeyer, Chien-In Henry Chen. Built-In Self-Test for Low-Voltage High-Speed Analog-to-Digital Converters. IEEE T. Instrumentation and Measurement, 56(6):2748-2756, 2007. [doi]
@article{WibbenmeyerC07,
title = {Built-In Self-Test for Low-Voltage High-Speed Analog-to-Digital Converters},
author = {Jason Wibbenmeyer and Chien-In Henry Chen},
year = {2007},
doi = {10.1109/TIM.2007.908343},
url = {http://dx.doi.org/10.1109/TIM.2007.908343},
tags = {testing},
researchr = {https://researchr.org/publication/WibbenmeyerC07},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {56},
number = {6},
pages = {2748-2756},
}