Stefan Wiefels, Xiaohua Liu, Kristoffer Schnieders, Mathias Schumacher, Rainer Waser, Lutz Nielen. Advanced Electrical Characterization of Memristive Arrays for Neuromorphic Applications. In IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2023, Milano, Italy, October 25-27, 2023. pages 1069-1074, IEEE, 2023. [doi]
Abstract is missing.