High-performance carrier interferometry OFDM WLANs: RF testing - researchr publication authors

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David Wiegandt, Zhiqiang Wu 0001, Carl Rudolph Nassar. High-performance carrier interferometry OFDM WLANs: RF testing. In Proceedings of IEEE International Conference on Communications, ICC 2003, Anchorage, Alaska, USA, 11-15 May, 2003. pages 203-207, IEEE, 2003. [doi]

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