David Wiegandt, Zhiqiang Wu 0001, Carl Rudolph Nassar. High-performance carrier interferometry OFDM WLANs: RF testing. In Proceedings of IEEE International Conference on Communications, ICC 2003, Anchorage, Alaska, USA, 11-15 May, 2003. pages 203-207, IEEE, 2003. [doi]
@inproceedings{WiegandtWN03-0,
title = {High-performance carrier interferometry OFDM WLANs: RF testing},
author = {David Wiegandt and Zhiqiang Wu 0001 and Carl Rudolph Nassar},
year = {2003},
doi = {10.1109/ICC.2003.1204170},
url = {http://dx.doi.org/10.1109/ICC.2003.1204170},
researchr = {https://researchr.org/publication/WiegandtWN03-0},
cites = {0},
citedby = {0},
pages = {203-207},
booktitle = {Proceedings of IEEE International Conference on Communications, ICC 2003, Anchorage, Alaska, USA, 11-15 May, 2003},
publisher = {IEEE},
isbn = {0-7803-7802-4},
}