James G. Wilber. Enhancing Device Test Programming Productivity: The CATalyst Automated Test Program Generator. In Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985. pages 252-262, IEEE Computer Society, 1985.
@inproceedings{Wilber85:0,
title = {Enhancing Device Test Programming Productivity: The CATalyst Automated Test Program Generator},
author = {James G. Wilber},
year = {1985},
tags = {testing, programming},
researchr = {https://researchr.org/publication/Wilber85%3A0},
cites = {0},
citedby = {0},
pages = {252-262},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985},
publisher = {IEEE Computer Society},
}