Sally Wilk. Effective Implementation of Statistical Process Control in an Integrated Circuit Test Environment. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 437-445, IEEE Computer Society, 1991.
@inproceedings{Wilk91:0,
title = {Effective Implementation of Statistical Process Control in an Integrated Circuit Test Environment},
author = {Sally Wilk},
year = {1991},
tags = {meta-model, testing, Meta-Environment, meta-objects},
researchr = {https://researchr.org/publication/Wilk91%3A0},
cites = {0},
citedby = {0},
pages = {437-445},
booktitle = {Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
publisher = {IEEE Computer Society},
isbn = {0-8186-9156-5},
}