T. W. Williams. Testing in Nanometer Technologies. In 1999 Design, Automation and Test in Europe (DATE 99), 9-12 March 1999, Munich, Germany. pages 5, IEEE Computer Society, 1999. [doi]
@inproceedings{Williams99:0,
title = {Testing in Nanometer Technologies},
author = {T. W. Williams},
year = {1999},
url = {http://csdl.computer.org/comp/proceedings/date/1999/0078/00/00780005abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/Williams99%3A0},
cites = {0},
citedby = {0},
pages = {5},
booktitle = {1999 Design, Automation and Test in Europe (DATE 99), 9-12 March 1999, Munich, Germany},
publisher = {IEEE Computer Society},
isbn = {0-7695-0078-1},
}