Thomas W. Williams, Rohit Kapur, M. Ray Mercer, Robert H. Dennard, Wojciech Maly. Iddq Testing for High Performance CMOS - The Next Ten Years. In 1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996. pages 578-583, IEEE Computer Society, 1996. [doi]
@inproceedings{WilliamsKMDM96,
title = {Iddq Testing for High Performance CMOS - The Next Ten Years},
author = {Thomas W. Williams and Rohit Kapur and M. Ray Mercer and Robert H. Dennard and Wojciech Maly},
year = {1996},
doi = {10.1109/EDTC.1996.494359},
url = {http://doi.ieeecomputersociety.org/10.1109/EDTC.1996.494359},
researchr = {https://researchr.org/publication/WilliamsKMDM96},
cites = {0},
citedby = {0},
pages = {578-583},
booktitle = {1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996},
publisher = {IEEE Computer Society},
isbn = {0-8186-7423-7},
}