Efficient regression testing of multi-panel systems

Clay Williams, Amit M. Paradkar. Efficient regression testing of multi-panel systems. In 10th International Symposium on Software Reliability Engineering, ISSRE, 1999, Boca Raton, FL, USA, November 1-4, 1999. pages 158-165, IEEE Computer Society, 1999. [doi]

Authors

Clay Williams

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Amit M. Paradkar

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