Clay Williams, Amit M. Paradkar. Efficient regression testing of multi-panel systems. In 10th International Symposium on Software Reliability Engineering, ISSRE, 1999, Boca Raton, FL, USA, November 1-4, 1999. pages 158-165, IEEE Computer Society, 1999. [doi]
@inproceedings{WilliamsP99-0,
title = {Efficient regression testing of multi-panel systems},
author = {Clay Williams and Amit M. Paradkar},
year = {1999},
doi = {10.1109/ISSRE.1999.809320},
url = {http://dx.doi.org/10.1109/ISSRE.1999.809320},
researchr = {https://researchr.org/publication/WilliamsP99-0},
cites = {0},
citedby = {0},
pages = {158-165},
booktitle = {10th International Symposium on Software Reliability Engineering, ISSRE, 1999, Boca Raton, FL, USA, November 1-4, 1999},
publisher = {IEEE Computer Society},
isbn = {0-7695-0443-4},
}