Pieter De Wit, Georges G. E. Gielen. Degradation-Resilient Design of a Self-Healing xDSL Line Driver in 90 nm CMOS. J. Solid-State Circuits, 47(7):1757-1767, 2012. [doi]
@article{WitG12,
title = {Degradation-Resilient Design of a Self-Healing xDSL Line Driver in 90 nm CMOS},
author = {Pieter De Wit and Georges G. E. Gielen},
year = {2012},
doi = {10.1109/JSSC.2012.2191328},
url = {http://dx.doi.org/10.1109/JSSC.2012.2191328},
researchr = {https://researchr.org/publication/WitG12},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {47},
number = {7},
pages = {1757-1767},
}