Pascal Witte, John G. Kauffman, Timon Brückner, Joachim Becker, Maurits Ortmanns. An error estimation technique for lowpass and bandpass ΣΔ ADC feedback DACs using a residual test signal. In 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012. pages 73-76, IEEE, 2012. [doi]
@inproceedings{WitteKBBO12,
title = {An error estimation technique for lowpass and bandpass ΣΔ ADC feedback DACs using a residual test signal},
author = {Pascal Witte and John G. Kauffman and Timon Brückner and Joachim Becker and Maurits Ortmanns},
year = {2012},
doi = {10.1109/ISCAS.2012.6272140},
url = {http://dx.doi.org/10.1109/ISCAS.2012.6272140},
researchr = {https://researchr.org/publication/WitteKBBO12},
cites = {0},
citedby = {0},
pages = {73-76},
booktitle = {2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012},
publisher = {IEEE},
isbn = {978-1-4673-0218-0},
}