Achieving extreme scan compression for SoC Designs

Peter Wohl, John A. Waicukauski, Jonathon E. Colburn, Milind Sonawane. Achieving extreme scan compression for SoC Designs. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-8, IEEE, 2014. [doi]

Authors

Peter Wohl

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John A. Waicukauski

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Jonathon E. Colburn

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Milind Sonawane

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