Peter Wohl, John A. Waicukauski, Jonathon E. Colburn, Milind Sonawane. Achieving extreme scan compression for SoC Designs. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-8, IEEE, 2014. [doi]
@inproceedings{WohlWCS14,
title = {Achieving extreme scan compression for SoC Designs},
author = {Peter Wohl and John A. Waicukauski and Jonathon E. Colburn and Milind Sonawane},
year = {2014},
doi = {10.1109/TEST.2014.7035294},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035294},
researchr = {https://researchr.org/publication/WohlWCS14},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014},
publisher = {IEEE},
isbn = {978-1-4799-4722-5},
}