Peter Wohl, John A. Waicukauski, Sanjay Patel, Minesh B. Amin. X-Tolerant Compression And Application of Scan-ATPG Patterns In A BIST Architecture. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 727-736, IEEE Computer Society, 2003. [doi]
@inproceedings{WohlWPA03:0,
title = {X-Tolerant Compression And Application of Scan-ATPG Patterns In A BIST Architecture},
author = {Peter Wohl and John A. Waicukauski and Sanjay Patel and Minesh B. Amin},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20630727abs.htm},
tags = {architecture},
researchr = {https://researchr.org/publication/WohlWPA03%3A0},
cites = {0},
citedby = {0},
pages = {727-736},
booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA},
publisher = {IEEE Computer Society},
isbn = {0-7803-8106-8},
}