Peter Wohl, John A. Waicukauski, Sanjay Patel, Minesh B. Amin. X-Tolerant Compression And Application of Scan-ATPG Patterns In A BIST Architecture. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 727-736, IEEE Computer Society, 2003. [doi]
Abstract is missing.