Eric Woirgard, F. Arabi, Wissam Sabbah, D. Martineau, L. Théolier, Stephane Azzopardi. Identification and analysis of power substrates degradations subjected to severe aging tests. Microelectronics Reliability, 55(9-10):1961-1965, 2015. [doi]
@article{WoirgardASMTA15,
title = {Identification and analysis of power substrates degradations subjected to severe aging tests},
author = {Eric Woirgard and F. Arabi and Wissam Sabbah and D. Martineau and L. Théolier and Stephane Azzopardi},
year = {2015},
doi = {10.1016/j.microrel.2015.06.048},
url = {http://dx.doi.org/10.1016/j.microrel.2015.06.048},
researchr = {https://researchr.org/publication/WoirgardASMTA15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {9-10},
pages = {1961-1965},
}