Monitoring and diagnosis of a multistage manufacturing process using Bayesian networks

Eric Wolbrecht, Bruce D Ambrosio, Robert Paasch, Doug Kirby. Monitoring and diagnosis of a multistage manufacturing process using Bayesian networks. AI EDAM, 14(1):53-67, 2000.

Authors

Eric Wolbrecht

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Bruce D Ambrosio

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Robert Paasch

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Doug Kirby

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