Eric Wolbrecht, Bruce D Ambrosio, Robert Paasch, Doug Kirby. Monitoring and diagnosis of a multistage manufacturing process using Bayesian networks. AI EDAM, 14(1):53-67, 2000.
@article{WolbrechtDPK00,
title = {Monitoring and diagnosis of a multistage manufacturing process using Bayesian networks},
author = {Eric Wolbrecht and Bruce D Ambrosio and Robert Paasch and Doug Kirby},
year = {2000},
tags = {process monitoring},
researchr = {https://researchr.org/publication/WolbrechtDPK00},
cites = {0},
citedby = {0},
journal = {AI EDAM},
volume = {14},
number = {1},
pages = {53-67},
}