An analysis of fault partitioned parallel test generation

Joseph M. Wolf, Lori M. Kaufman, Robert H. Klenke, James H. Aylor, Ronald Waxman. An analysis of fault partitioned parallel test generation. IEEE Trans. on CAD of Integrated Circuits and Systems, 15(5):517-534, 1996. [doi]

Authors

Joseph M. Wolf

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Lori M. Kaufman

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Robert H. Klenke

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James H. Aylor

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Ronald Waxman

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