Mike W. T. Wong. Issues Related to the Formulation of DFT Solution for Analog Circuit Test Using Equivalent Fault Analysis. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 120-123, IEEE Computer Society, 2003. [doi]
@inproceedings{Wong03:4,
title = {Issues Related to the Formulation of DFT Solution for Analog Circuit Test Using Equivalent Fault Analysis},
author = {Mike W. T. Wong},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/ats/2003/1951/00/19510120abs.htm},
tags = {testing, analysis},
researchr = {https://researchr.org/publication/Wong03%3A4},
cites = {0},
citedby = {0},
pages = {120-123},
booktitle = {12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China},
publisher = {IEEE Computer Society},
isbn = {0-7695-1951-2},
}