Effects of non-fatal electrostatic discharge on the threshold voltage degradation in nano CMOS devices

Hei Wong, Shurong Dong, Zehua Chen. Effects of non-fatal electrostatic discharge on the threshold voltage degradation in nano CMOS devices. Science in China Series F: Information Sciences, 65(2), 2022. [doi]

Authors

Hei Wong

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Shurong Dong

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Zehua Chen

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