Hei Wong, Shurong Dong, Zehua Chen. Effects of non-fatal electrostatic discharge on the threshold voltage degradation in nano CMOS devices. Science in China Series F: Information Sciences, 65(2), 2022. [doi]
@article{WongDC22,
title = {Effects of non-fatal electrostatic discharge on the threshold voltage degradation in nano CMOS devices},
author = {Hei Wong and Shurong Dong and Zehua Chen},
year = {2022},
doi = {10.1007/s11432-020-3197-8},
url = {https://doi.org/10.1007/s11432-020-3197-8},
researchr = {https://researchr.org/publication/WongDC22},
cites = {0},
citedby = {0},
journal = {Science in China Series F: Information Sciences},
volume = {65},
number = {2},
}