Chan-Yuan Wong, Hon-Ngen Fung. Post Catch-up Trajectories: Publishing and Patenting Activities of China and Korea. In Wolfgang Glänzel, Henk F. Moed, Ulrich Schmoch, Mike Thelwall, editors, Springer Handbook of Science and Technology Indicators. Springer Handbooks, pages 1037-1055, Springer, 2019. [doi]
@incollection{WongF19,
title = {Post Catch-up Trajectories: Publishing and Patenting Activities of China and Korea},
author = {Chan-Yuan Wong and Hon-Ngen Fung},
year = {2019},
doi = {10.1007/978-3-030-02511-3_43},
url = {https://doi.org/10.1007/978-3-030-02511-3_43},
researchr = {https://researchr.org/publication/WongF19},
cites = {0},
citedby = {0},
pages = {1037-1055},
booktitle = {Springer Handbook of Science and Technology Indicators},
editor = {Wolfgang Glänzel and Henk F. Moed and Ulrich Schmoch and Mike Thelwall},
series = {Springer Handbooks},
publisher = {Springer},
isbn = {978-3-030-02511-3},
}