Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Hei Wong, V. A. Gritsenko. Defects in silicon oxynitride gate dielectric films. Microelectronics Reliability, 42(4-5):597-605, 2002. [doi]