Seng Fat Wong, W. I. Ho, Zhixin Yang, C. T. Kwok. RFID-aided manufacturing training system and localization. In 2011 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), Singapore, Singapore, December 6-9, 2011. pages 447-451, IEEE, 2011. [doi]
@inproceedings{WongHYK11,
title = {RFID-aided manufacturing training system and localization},
author = {Seng Fat Wong and W. I. Ho and Zhixin Yang and C. T. Kwok},
year = {2011},
doi = {10.1109/IEEM.2011.6117957},
url = {http://dx.doi.org/10.1109/IEEM.2011.6117957},
researchr = {https://researchr.org/publication/WongHYK11},
cites = {0},
citedby = {0},
pages = {447-451},
booktitle = {2011 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), Singapore, Singapore, December 6-9, 2011},
publisher = {IEEE},
isbn = {978-1-4577-0740-7},
}