Waisum Wong, Juin J. Liou, Jiann-shiun Yuan, David M. Wu. Statistical sensitivity simulation for integrating design and testing of MOSFET integrated circuits. In 9th IEEE VLSI Test Symposium (VTS'91), 15-17 Apr 1991, Atlantic City, NJ, USA. pages 104-108, IEEE, 1991. [doi]
Abstract is missing.