E. H. Wong, Ranjan Rajoo, S. K. W. Seah, C. S. Selvanayagam, W. D. van Driel, J. F. J. M. Caers, X. J. Zhao, N. Owens, L. C. Tan, M. Leoni, P. L. Eu, Y.-S. Lai, C.-L. Yeh. Correlation studies for component level ball impact shear test and board level drop test. Microelectronics Reliability, 48(7):1069-1078, 2008. [doi]
@article{WongRSSDCZOTLELY08,
title = {Correlation studies for component level ball impact shear test and board level drop test},
author = {E. H. Wong and Ranjan Rajoo and S. K. W. Seah and C. S. Selvanayagam and W. D. van Driel and J. F. J. M. Caers and X. J. Zhao and N. Owens and L. C. Tan and M. Leoni and P. L. Eu and Y.-S. Lai and C.-L. Yeh},
year = {2008},
doi = {10.1016/j.microrel.2008.04.008},
url = {http://dx.doi.org/10.1016/j.microrel.2008.04.008},
tags = {testing, C++},
researchr = {https://researchr.org/publication/WongRSSDCZOTLELY08},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {48},
number = {7},
pages = {1069-1078},
}