Correlation studies for component level ball impact shear test and board level drop test

E. H. Wong, Ranjan Rajoo, S. K. W. Seah, C. S. Selvanayagam, W. D. van Driel, J. F. J. M. Caers, X. J. Zhao, N. Owens, L. C. Tan, M. Leoni, P. L. Eu, Y.-S. Lai, C.-L. Yeh. Correlation studies for component level ball impact shear test and board level drop test. Microelectronics Reliability, 48(7):1069-1078, 2008. [doi]

Abstract

Abstract is missing.