A Secure Scan Architecture Protecting Scan Test and Scan Dump Using Skew-Based Lock and Key

Hyungil Woo, Seokjun Jang, Sungho Kang. A Secure Scan Architecture Protecting Scan Test and Scan Dump Using Skew-Based Lock and Key. IEEE Access, 9:102161-102176, 2021. [doi]

Authors

Hyungil Woo

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Seokjun Jang

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Sungho Kang

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