A Secure Scan Architecture Protecting Scan Test and Scan Dump Using Skew-Based Lock and Key

Hyungil Woo, Seokjun Jang, Sungho Kang. A Secure Scan Architecture Protecting Scan Test and Scan Dump Using Skew-Based Lock and Key. IEEE Access, 9:102161-102176, 2021. [doi]

Abstract

Abstract is missing.