Impact of Variability Issues of Resistive Memory Synapses on Pattern Recognition Systems

Jiyong Woo, Miyoung Lee, Jeong Hun Kim, Jong-Pil Im, Solyee Im, Yeriaron Kim, Seung-Eon Moon, Joohyun Lee. Impact of Variability Issues of Resistive Memory Synapses on Pattern Recognition Systems. In International SoC Design Conference, ISOCC 2020, Yeosu, South Korea, October 21-24, 2020. pages 201-202, IEEE, 2020. [doi]

Abstract

Abstract is missing.