Seungwon Woo, Hyunseo Shin, Eunkyung Choi, Juheon Kang, Wonseok Hwang. K-SNAC: Robust Neuron Coverage for OOD Generalization and Test Adequacy. In 40th IEEE/ACM International Conference on Automated Software Engineering, ASE 2025 - Workshops, Seoul, Republic of Korea, November 16-20, 2025. pages 176-180, IEEE, 2025. [doi]
Abstract is missing.