Matthew Worsman, Mike W. T. Wong, Y. S. Lee. A Pre-Simulation Measure of D.C. Design-for-Testability Fault Diagnosis Quality. In 1st International Symposium on Quality of Electronic Design (ISQED 2000), 20-22 March 2000, San Jose, CA, USA. pages 361-368, IEEE Computer Society, 2000. [doi]
Abstract is missing.