Mitchell Wortsman, Gabriel Ilharco, Jong Wook Kim, Mike Li, Simon Kornblith, Rebecca Roelofs, Raphael Gontijo Lopes, Hannaneh Hajishirzi, Ali Farhadi, Hongseok Namkoong, Ludwig Schmidt. Robust fine-tuning of zero-shot models. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022, New Orleans, LA, USA, June 18-24, 2022. pages 7949-7961, IEEE, 2022. [doi]
Abstract is missing.