N. Wrachien, Andrea Cester, D. Bari, Raffaella Capelli, R. D'Alpaos, Michele Muccini, A. Stefani, G. Turatti, Gaudenzio Meneghesso. Effects of constant voltage stress on p- and n-type organic thin film transistors with poly(methyl methacrylate) gate dielectric. Microelectronics Reliability, 53(9-11):1798-1803, 2013. [doi]
Abstract is missing.