Nicola Wrachien, N. Lago, A. Rizzo, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini, Gaudenzio Meneghesso, Andrea Cester. Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics. Microelectronics Reliability, 55(9-10):1790-1794, 2015. [doi]
Abstract is missing.