Joe Wrinn. Two New Techniques for Identifying Opens on Printed Circuit Boards: Analog Junction Test & Radio Frequency Induction Test. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 927, IEEE Computer Society, 1995.
@inproceedings{Wrinn95,
title = {Two New Techniques for Identifying Opens on Printed Circuit Boards: Analog Junction Test & Radio Frequency Induction Test},
author = {Joe Wrinn},
year = {1995},
tags = {testing, source-to-source, open-source},
researchr = {https://researchr.org/publication/Wrinn95},
cites = {0},
citedby = {0},
pages = {927},
booktitle = {Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995},
publisher = {IEEE Computer Society},
isbn = {0-7803-2992-9},
}