Bing-Chen Wu, Wei-Ting Chen, Tsung-Te Liu. An Error-Resilient RISC-V Microprocessor With a Fully Integrated DC-DC Voltage Regulator for Near-Threshold Operation in 28-nm CMOS. J. Solid-State Circuits, 58(11):3275-3285, November 2023. [doi]
@article{WuCL23-4,
title = {An Error-Resilient RISC-V Microprocessor With a Fully Integrated DC-DC Voltage Regulator for Near-Threshold Operation in 28-nm CMOS},
author = {Bing-Chen Wu and Wei-Ting Chen and Tsung-Te Liu},
year = {2023},
month = {November},
doi = {10.1109/JSSC.2023.3287360},
url = {https://doi.org/10.1109/JSSC.2023.3287360},
researchr = {https://researchr.org/publication/WuCL23-4},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {58},
number = {11},
pages = {3275-3285},
}