Yanyan Wu, Faxiang Chen, Yajie Wang. CSN-YOLOv5s：A Novel Detection Algorithm for PCB Surface Defects. In De-Shuang Huang, Chuanlei Zhang, Qinhu Zhang, Yijie Pan, editors, Advanced Intelligent Computing Technology and Applications - 21st International Conference, ICIC 2025, Ningbo, China, July 26-29, 2025, Proceedings, Part III. Volume 15844 of Lecture Notes in Computer Science, pages 352-362, Springer, 2025. [doi]
Abstract is missing.