Review of Imaging Device Identification Based on Machine Learning

Jian Wu, Kai-Feng, Min Tian. Review of Imaging Device Identification Based on Machine Learning. In ICMLC 2020: 2020 12th International Conference on Machine Learning and Computing, Shenzhen, China, February 15-17, 2020. pages 105-110, ACM, 2020. [doi]

Abstract

Abstract is missing.