Wei Wu, Fang Gong, Gengsheng Chen, Lei He. A fast and provably bounded failure analysis of memory circuits in high dimensions. In 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014, Singapore, January 20-23, 2014. pages 424-429, IEEE, 2014. [doi]
@inproceedings{WuGCH14,
title = {A fast and provably bounded failure analysis of memory circuits in high dimensions},
author = {Wei Wu and Fang Gong and Gengsheng Chen and Lei He},
year = {2014},
doi = {10.1109/ASPDAC.2014.6742928},
url = {http://dx.doi.org/10.1109/ASPDAC.2014.6742928},
researchr = {https://researchr.org/publication/WuGCH14},
cites = {0},
citedby = {0},
pages = {424-429},
booktitle = {19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014, Singapore, January 20-23, 2014},
publisher = {IEEE},
}