Estimating Uncertainty in Line-Level Defect Prediction via Perceptual Borderline Oversampling

Chen Wu, Shikai Guo, Hui Li 0014, Chenchen Li, Rong Chen 0003. Estimating Uncertainty in Line-Level Defect Prediction via Perceptual Borderline Oversampling. ACM Transactions on Software Engineering Methodology, 35(4), April 2026. [doi]

Abstract

Abstract is missing.