Meng-Fan Wu, Kai-Shun Hu, Jiun-Lang Huang. LPTest: a Flexible Low-Power Test Pattern Generator. J. Electronic Testing, 25(6):323-335, 2009. [doi]
@article{WuHH09-2,
title = {LPTest: a Flexible Low-Power Test Pattern Generator},
author = {Meng-Fan Wu and Kai-Shun Hu and Jiun-Lang Huang},
year = {2009},
url = {http://springerlink.metapress.com/content/2415247u680v7020/},
tags = {testing},
researchr = {https://researchr.org/publication/WuHH09-2},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {25},
number = {6},
pages = {323-335},
}