A 21-bit read-out IC employing dynamic element matching with 0.037% gain error

Rong Wu, Johan H. Huijsing, Kofi A. A. Makinwa. A 21-bit read-out IC employing dynamic element matching with 0.037% gain error. In IEEE Asian Solid-State Circuits Conference, A-SSCC 2011, Jeju, South Korea, November 14-16, 2011. pages 241-244, IEEE, 2011. [doi]

@inproceedings{WuHM11-1,
  title = {A 21-bit read-out IC employing dynamic element matching with 0.037% gain error},
  author = {Rong Wu and Johan H. Huijsing and Kofi A. A. Makinwa},
  year = {2011},
  doi = {10.1109/ASSCC.2011.6123647},
  url = {http://dx.doi.org/10.1109/ASSCC.2011.6123647},
  researchr = {https://researchr.org/publication/WuHM11-1},
  cites = {0},
  citedby = {0},
  pages = {241-244},
  booktitle = {IEEE Asian Solid-State Circuits Conference, A-SSCC 2011, Jeju, South Korea, November 14-16, 2011},
  publisher = {IEEE},
  isbn = {978-1-4577-1784-0},
}