The following publications are possibly variants of this publication:
- Probe calibration by using a different type of probe as a reference in GTEM cell above 1GHzIfong Wu, Shinobu Ishigami, Kaoru Gotoh, Yasushi Matsumoto. ieiceee, 7(6):460-466, 2010. [doi]
- The effect of a low dielectric material placed at the tip of a GTEM cell on the electric fieldIfong Wu, Shinobu Ishigami, Kaoru Gotoh, Yasushi Matsumoto. ieiceee, 6(22):1608-1614, 2009. [doi]
- Calibration of electric field probes with three orthogonal elements by standard field methodIfong Wu, Shinobu Ishigami, Kaoru Gotoh, Yasushi Matsumoto. ieiceee, 6(14):1032-1038, 2009. [doi]