Ernest Y. Wu, Baozhen Li. Quantum Mechanical Connection of Schottky Emission Process and Its implications on Breakdown Methodology and Conduction Modeling for BEOL Low-k Dielectrics. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 10, IEEE, 2022. [doi]
@inproceedings{WuL22-12,
title = {Quantum Mechanical Connection of Schottky Emission Process and Its implications on Breakdown Methodology and Conduction Modeling for BEOL Low-k Dielectrics},
author = {Ernest Y. Wu and Baozhen Li},
year = {2022},
doi = {10.1109/IRPS48227.2022.9764501},
url = {https://doi.org/10.1109/IRPS48227.2022.9764501},
researchr = {https://researchr.org/publication/WuL22-12},
cites = {0},
citedby = {0},
pages = {10},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022},
publisher = {IEEE},
isbn = {978-1-6654-7950-9},
}