Wen Ching Wu, Chung-Len Lee, Jwu E. Chen, Won Yih Lin. Distributed Fault Simulation for Sequential Circuits by Pattern Partitioning. In Robert Werner, editor, EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28 - March 3, 1994, Paris, France. pages 661, IEEE Computer Society, 1994.
@inproceedings{WuLCL94,
title = {Distributed Fault Simulation for Sequential Circuits by Pattern Partitioning},
author = {Wen Ching Wu and Chung-Len Lee and Jwu E. Chen and Won Yih Lin},
year = {1994},
tags = {partitioning},
researchr = {https://researchr.org/publication/WuLCL94},
cites = {0},
citedby = {0},
pages = {661},
booktitle = {EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28 - March 3, 1994, Paris, France},
editor = {Robert Werner},
publisher = {IEEE Computer Society},
isbn = {0-8186-5410-4},
}